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Dr C Ducati

The purpose of this course is to introduce the student to electron microscopy imaging and analytical techniques used in Materials Science.

We will describe electron optics and detectors used in scanning and transmission electron microscopes, and explain how different signals are formed and collected to characterise the microstructure of materials. We will focus on the concepts of signal and contrast, and explain how images and analytical signals can be interpreted quantitatively.

Through examples, will explore how SEM and TEM techniques are applied to study specific materials problems.

This lecture course will cover:

Scanning electron microscopy

  • Electron optics and detectors in the SEM
  • Beam specimen interactions
  • Image formation and contrast mechanisms in the SEM
  • X-ray microanalysis

Transmission electron microscopy

  • Electron optics and detectors in the TEM
  • Image formation and main contrast mechanisms in TEM